Which mechanism causes dielectric breakdown within solid-state capacitor when exposed transient overvoltage?

💡 Explanation

When transient overvoltage occurs, charge carrier avalanche multiplication is initiated by high electric fields accelerating electrons, increasing their kinetic energy and upon impact generate more free charge carriers, leading rapidly to a conductive path across the dielectric and results in breakdown. Therefore charge carrier avalanche multiplication is resultant outcome, rather than oxidation, leakage and thermal expansion, which involve slower degradation or different triggering events.

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