Which outcome arises when elevated gate-source voltage impacts MOSFET performance?

💡 Explanation

Gate-to-source over-voltage accelerates Fowler-Nordheim tunneling through the MOSFET's thin gate oxide. Because excessive charge tunnels, it causes dielectric breakdown, therefore permanent damage occurs, rather than performance degradation or channel modulation changes.

• Which outcome occurs when exceeding the critical surface speed between a lathe cutting tool and a workpiece?
• Which operational effect results from ice accretion at static ports during flight?
• Within Dense Wavelength Division Multiplexing (DWDM) fiber optic systems, which outcome accelerates as channel spacing decreases?
• Which outcome occurs when transient throttling affects staged turbochargers?
• Which risk increases significantly when hydraulic actuator seals degrade in an automated assembly robot?
• Which action optimizes heat transfer efficiency in plate heat exchangers?