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Which outcome occurs due to electron scarcity in deep submicron transistors?

A)Increased gate oxide leakage
B)Suppressed drain-induced barrier lowering
C)Decreased transistor threshold voltage
D)Enhanced channel hot carrier injection

💡 Explanation

Increased gate oxide leakage occurs because decreased channel length accentuates **quantum tunneling** through the thin gate oxide. Thus electrons tunnel through the gate oxide barrier rather than following lower resistance paths, therefore creating leakage, not reduced barrier lowering.

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