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← TechnologyWhich outcome occurs when an aluminum interconnect on a silicon die experiences significant electromigration?
A)Increased resistance forms open circuits✓
B)Junction leakage leads to latch-up
C)Substrate doping shifts to p-type
D)Gate oxide breakdown becomes negligible
💡 Explanation
Electromigration displaces metal ions because of momentum transfer from conducting electrons (wind force) resulting in voids; therefore, increased resistance culminating in open circuits occurs rather than junction or substrate effects because those are separate effects.
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