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← ScienceWhich risk increases during a flash memory write operation?
A)Increased bit error probability✓
B)Reduced cell endurance lifetime
C)Higher power supply transients
D)Greater program disturb failures
💡 Explanation
Increased bit error probability results because quantum tunneling erases adjacent cells during programming, which alters their threshold voltages; therefore errors arise rather than endurance degradation because the mechanism directly affects stored charge.
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