Which risk increases significantly when applying reverse bias to semiconductors?

💡 Explanation

Avalanche breakdown damages the gate oxide integrity because impact ionization increases exponentially in depletion region; therefore, substantial reverse current leads to permanent damage rather than controlled Zener behavior under lower voltages.

• Which failure mode results when electrons fill a band at high temperatures in a semiconductor strain gauge?
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• Which risk increases when a pulsed laser's coherence length nears the target's dimension?