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Which risk increases when a flash memory cell is programmed?

A)Adjacent cell data bit corruption
B)Increased thermal runaway threshold
C)Write speed approaches zero
D)Gate oxide layer crystallization

💡 Explanation

Adjacent cell data can change due to Fowler-Nordheim tunneling. Erasing or programming a cell requires high voltage, because electrons tunnel through the oxide layer to charge the floating gate; therefore, a nearby cell may unintentionally gain charge rather than remain stable.

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