Live Quiz Arena
🎁 1 Free Round Daily
⚡ Enter ArenaQuestion
← ScienceWhich risk increases when a high-power microwave beam disrupts a satellite's CMOS sensors?
A)Single event upset vulnerability✓
B)Increased data bus capacitance
C)Localized component melting
D)Antenna impedance mismatching
💡 Explanation
A single microwave pulse can cause single event upset (SEU) because electromagnetic induction creates spurious currents within the sensor. This exceeds threshold trigger levels therefore random bit flips occur rather than thermal damage or capacitance shifts under nominal operation.
🏆 Up to £1,000 monthly prize pool
Ready for the live challenge? Join the next global round now.
*Terms apply. Skill-based competition.
Related Questions
Browse Science →- Which outcome occurs when exceeding the adiabatic cooling limit in liquefaction?
- Which consequence results when increased doping modifies gallium arsenide's energy bands?
- Which outcome accelerates diffusion-driven hydrogen embrittlement in austenitic stainless steel?
- Which outcome occurs when a thin oil film rests on water?
- Which effect arises when a high-powered laser ablates material?
- Which failure impacts a superconductor exposed to substantial electrical current?