Which risk increases when a parallel plate capacitor's dielectric material degrades under strong electric field stress?

💡 Explanation

When a dielectric in a capacitor degrades at high electric field strength, increased leakage and localized heating occurs due to reduced resistivity, leading to accelerated propagation of thermal runaway. Therefore, accelerated thermal runaway risk increases rather than saturation, drift, or reversal, which are linked to magnetic or material phase transitions instead.

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