VibraXX
Live Quiz Arena
🎁 1 Free Round Daily
⚡ Enter Arena
HomeCategoriesScienceQuestion
Question
Science

Which risk increases when a pulsed electromagnetic field exceeds shielding limits?

A)Component malfunction due to induced currents
B)Increased thermal noise in semiconductors
C)Crystal structure dislocation in metals
D)Enhanced radioactive decay of insulators

💡 Explanation

Exceeding the EM shielding limit induces unwanted voltages via electromagnetic induction, this causes currents in sensitive components. Therefore, malfunction increases rather than thermal noise or structure change, because EM induction dominates at faster pulses.

🏆 Up to £1,000 monthly prize pool

Ready for the live challenge? Join the next global round now.
*Terms apply. Skill-based competition.

⚡ Enter Arena

Related Questions

Browse Science