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Which risk increases when a scanning tunneling microscope uses an excessively high bias voltage?

A)Unintentional molecular bond disruption occurs
B)Electron localisation significantly decreases
C)Tip apex experiences thermal expansion
D)Mechanical resonance introduces imaging artifacts

💡 Explanation

Excessive voltage causes significant current, leading to unintended electron-induced bond dissociation between the tip and sample due to inelastic tunneling. Therefore, molecular disruption risk increases rather than improved imaging precision or mechanical resonance because higher bias focuses greater electron flow.

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