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Which risk increases when electronic heat sink fan RPM degrades due to dust accumulation?

A)Thermal runaway of power transistor
B)Capacitor ESR decrease from vibration
C)Connector failure from fretting corrosion
D)Inductor saturation from back-EMF

💡 Explanation

When fan RPM degrades, convective heat transfer decreases because airflow diminishes, causing junction temperature to rise, accelerating the device towards thermal runaway. Therefore transistor thermal runaway is more likely, rather than capacitor, connector, or inductor problems which require different stimuli like high frequency currents or repetitive movement.

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