Which risk increases when partially spatially coherent light illuminates patterned silicon wafers?

💡 Explanation

Significant variations in optical path lengths give rise to speckle contrast. Enhanced spatial coherence yields amplified interference fringes because each point acts as a coherent source; therefore speckle artifacts are more pronounced, rather than blurred resolutions driven by incoherent sources.

• Which risk increases when repeatedly cycling a heat pump using a Carnot cycle with high temperature differentials?
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