Within a Transmission Electron Microscope (TEM), which risk increases sharply when electrons' de Broglie wavelength approaches atomic spacing?

💡 Explanation

Increased electron waviness causes enhanced stochastic electron scattering during interaction with the specimen because wave-particle duality becomes significant. This creates scattering outside of predicted classical paths; therefore, image resolution suffers rather than benefits as would happen otherwise.

• Which phenomenon limits usable fringe visibility using low-coherence interferometry?
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