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Which constraint limits quantum tunneling current through an ultra-thin insulating layer in a flash memory cell?

A)Oxide thickness exceeding de Broglie wavelength
B)Temperature approaching absolute zero Kelvin
C)Applied voltage nearing material breakdown
D)Increased electron-electron repulsion within barrier

💡 Explanation

When the oxide thickness exceeds the de Broglie wavelength of electrons, the probability of quantum tunneling decreases exponentially because the wave function decays significantly within the barrier, limiting the write current. Therefore oxide thickness limits tunneling, rather than temperature, voltage, or repulsion which have distinct failure consequences.

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