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Which failure results when gate oxide thickness decreases in FETs?

A)Increased gate leakage current
B)Reduced channel mobility occurs
C)Subthreshold swing increases
D)Reduced drain saturation current

💡 Explanation

Decreasing gate oxide thickness increases the probability of quantum tunneling. This allows electrons to tunnel through the oxide layer, because the potential barrier width decreases, therefore increasing gate leakage current rather than changing channel or drain behavior.

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