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Which mechanism causes increasing electrical breakdown risk in aerogel?

A)Avalanche multiplication of defect electrons
B)Interface crack propagation acceleration
C)Localized delamination triggering discharge
D)Thermal runaway in the conduction band

💡 Explanation

Electrical breakdown rises in aerogel because the avalanche multiplication mechanism increases current non-linearly; localized electrons quickly gain energy at structural defects. Thus, defect electrons create cascades leading to breakdown, rather than cracking or thermal effects.

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