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← TechnologyWhich outcome commonly occurs in gallium nitride (GaN) power transistors at high switching frequencies?
A)Increased gate leakage current✓
B)Reduced thermal management efficacy
C)Enhanced substrate electron mobility
D)Improved carrier saturation velocity
💡 Explanation
Increased gate leakage current results from parasitic capacitance within GaN transistors; this causes unwanted current flow under high-frequency switching because displacement current rises with frequency, therefore reducing efficiency rather than increasing electron mobility or saturation.
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