Which outcome occurs when overheating causes excessive electron-hole pairs in a MOSFET?

💡 Explanation

Increased electron-hole pairs lead to worsened drain-source cutoff, because electron-hole recombination induces substantial sub-threshold conduction; therefore, the channel leakage current increases; rather than improving performance, the leakage compromises the off-state dynamics.

• Which conduction failure may occur when excessive gate-source voltage endangers a MOSFET?
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